Low‑Field Continuous-Wave Electrically Detected Magnetic Resonance Spectrometers
Blue Spin LLC designs and fabricates zero‑ and low‑field electrically detected magnetic resonance (EDMR) spectrometers enabling highly sensitive detection of defects in fully processed nano‑ and microelectronic devices.
What is EDMR?
Electrically detected magnetic resonance (EDMR) is the electrical detection of the electron paramagnetic resonance (EPR) of atomic‑scale defects within fully processed microelectronic devices. Because EDMR detects only those defects that influence device current, it provides orders‑of‑magnitude higher sensitivity than conventional EPR, particularly at zero and low magnetic fields.
Why Low‑Field?
- ~10 million× higher sensitivity than EPR
- No large magnets or cryogenic cooling
- Reduced cost, footprint, and power
- Linewidth sharpening from reduced g-strain
- Observation of state mixing at zero-field
What You Can Measure?
- Spin‑dependent recombination (SDR)
- Spin‑dependent trap‑assisted tunneling (SDTT)
- Electron nuclear hyperfine interactions at low field
- Atomic defect identification
- Magnetic field sensing sensitivity assessment
Applications
- MOSFETs, BJTs, diodes
- Solar cells and thin‑film dielectrics
- Si, SiC, GaN, and organic semiconductors
- Research and teaching tool
Products
We specialize in the development of low‑field EDMR spectrometers and supporting hardware, including custom Helmholtz coils and ultra‑low‑noise current preamplifiers.
BS‑LF250‑V1.0 Low‑Field EDMR Spectrometer
- Low‑field operation (±150 G)
- 200–400 MHz RF excitation with 16 dBm output
- Digital lock‑in detection with harmonic analysis
- Computer‑controlled via LabVIEW‑based software
- No cryogenics or large electromagnets required
About Blue Spin LLC
Blue Spin LLC was founded in 2013 at The Pennsylvania State University by Patrick M. Lenahan and Corey J. Cochrane. The company focuses on the development of low‑field EDMR instrumentation for device reliability, defect physics, and spin‑dependent transport research.
Selected Publications
- C.J. Cochrane & P.M. Lenahan, “Spin counting in electrically detected magnetic resonance via low-field defect state mixing”, Appl. Phys. Lett., 104(9), 093503 (2014). https://doi.org/10.1063/1.4867507
- C.J. Cochrane & P.M. Lenahan, “Detection of interfacial Pb centers in Si/SiO₂ metal-oxide-semiconducting field-effect transistors via zero-field spin dependent recombination with observation of precursor pair spin-spin interactions”, Appl. Phys. Lett., 103(5), 053506 (2013). https://doi.org/10.1063/1.4817264
- C.J. Cochrane & P.M. Lenahan, “Zero-field detection of spin dependent recombination with direct observation of electron nuclear hyperfine interactions in the absence of an oscillating electromagnetic field”, J. Appl. Phys., 112(12), 123714 (2012). https://doi.org/10.1063/1.4770472
- C.J. Cochrane & P.M. Lenahan, “Zero/low field SDR and SDT used for atomic scale probes of NBTI and TDDB”, Proc. IEEE IIRW, South Lake Tahoe, pp. 88-89 (2013). https://doi.org/10.1109/IIRW.2013.6804165
- C.J. Cochrane & P.M. Lenahan, “A Means to Study Reliability Based Defects in Fully Processed Devices Utilizing Zero-Field Spin Dependent Transport”, Proc. IEEE IIRW, South Lake Tahoe, pp. 45-47 (2012). https://doi.org/10.1109/IIRW.2012.6468917
Contact
For product information, sales inquiries, or collaborations, please contact us:
Email: info@bluespinllc.com